Role in the Centre
As a diffractionist, Tony Wang leads the infrastructure development of X-ray diffractometers in the X-ray Lab of QUT’s Central Analytical Research Facility (CARF). Here he designs the most suitable measurement geometry for recording diffraction signals from crystalline phases in diverse samples including powders, thin films, bulks and foils. Tony devotes himself to helping researchers extract quantitative information from the measured XRD patterns and professionally presenting the results in peer-reviewed journal articles. This includes monitoring sample phase changes at elevated temperatures and different atmospheres. Tony’s expertise lies in building new XRD infrastructure for a range of applications including phase identification, quantitative phase analysis, clay mineral identification, thin film grazing incident diffraction, high-resolution XRD and reciprocal space mapping for epitaxial layers, residual stress and texture, and micro-diffraction for phase mapping. Tony has published and is continuously developing new residual stress measurement methods for polycrystalline thin film samples, involving combined multi-axes movements of Eulerian cradle. Tony runs regular XRD workshops for CARF users and researchers to advance their XRD data analysis skills. He is more than happy to help researchers’ test new XRD ideas and non-conventional XRD measurements.
Tony completed a Bachelor degree of Solid State Electronics and a Master Degree of Material Science at the University of Electronic Science and Technology of China before joining Intel Product (Chengdu) Ltd. as a Quality and Reliability Engineer. In recognition of his work applying new integrated chip packaging technology, Tony was granted an Australian Endeavour Postgraduate Scholarship to complete a combined PhD with Curtin Physics and CSIRO Mineral. His PhD research revealed the impact of mineral intergrowth on their acid leaching performance based on detailed analyses using TEM/SAED, EFTEM/EELS, QXRD, SEM/EDS characterisation techniques. Tony also successfully implemented a turbostratic disorder model for clay mineral quantification in TOPAS software for the first time. Following his passion for XRD analysis, Tony joined Bruker AXS Singapore as an XRD Application Scientist, servicing Bruker customers in APAC countries. With four years’ experience with a wide range of customers, he is familiar with most of the typical applications in the field of XRD analysis. After joining QUT, Tony led the replacement of a worn x-ray diffractometer with a Co/Cr soft X-ray Diffraction High Throughput Platform, ensuring the state-of-the-art technology filled the gap in XRD applications in Queensland.
“Omega–Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films” Wang, X.; van Riessen, A. Powder Diffr. 2018, 32(S2), S9-S15.
“X-ray Diffraction Line Profile Analysis of Acid Resistant Goethite in Western Australian Nickel Laterite Ore” Wang, X.; Li, J.; McDonald, R.G.; van Riessen, A.; Hart, R.D. J Appl. Crystallogr. 2015, 48, 814–826.
“Acid resistance of goethite in nickel laterite ore from Western Australia. Part II. Effect of liberating cementations on acid leaching performance” Wang, X.; McDonald, R.G.; Hart, R.D.; Li, J.; van Riessen, A. Hydrometallurgy 2014, 141, 49–58.
“Acid resistance of goethite in nickel laterite ore from Western Australia. Part I. The relationship between goethite morphologies and acid leaching performance” Wang, X.; McDonald, R.G.; Hart, R.D.; Li, J.; van Riessen, A. Hydrometallurgy 2013, 140, 48–58.
“Quantitative analysis of turbostratically disordered nontronite with a supercell model calibrated by the PONKCS method” Wang, X.; Hart, R.D.; Li, J.; McDonald, R.G.; van Riessen, A. J Appl. Crystallogr. 2012, 45(6), 1295–1302.