Dr Robert Jones

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Role within the Centre

Working within the Central Analytical Research Facility (CARF), Robert advises and collaborates with researchers on projects utilising time-of-flight secondary-ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS). He maintains and operates QUT’s new ToF-SIMS instrument, develops applications in support of researcher needs, trains users, and contributes to data interpretation and publication.

Short Biography

After completing his Ph.D. at the University of South Australia, Robert worked at La Trobe University as a Research Fellow, where his principal role was to provide surface-analytical services to research and commercial clients. While there, he gained experience, and developed expertise, not only in ToF-SIMS and XPS, but also Auger electron spectroscopy and microscopy, and scanning probe microscopy, which he applied to the analysis of a wide range of material types. He was recruited to QUT in 2019.

Selected Publications

“Facile deposition of mesoporous PbI2 through DMF:DMSO solvent engineering for sequentially deposited metal halide perovskites” Li, B.; Shi, J.; Lu, J.; Tan, W.L.; Yin, W.; Sun, J.; Jiang, L.; Jones, R.T.; Pigram, P.; McNeill, C. R.; Cheng, Y-B.; and Jasieniak, J.J. ACS Appl. Energy Mater. 2020, 3(4), 3358-3368.

“Visualizing ToF-SIMS Hyperspectral Imaging Data Using Color-Tagged Toroidal Self-Organizing Maps” Gardner, W.; Cutts, S.M.; Muir, B.W.; Jones, R.T.; Pigram, P.J. Anal. Chem. 2019, 91(21), 13855–13865.

“A Surface Study of the Native Oxide upon a Compositionally Complex Alloy” Qiu, Y.; Gupta, R.K.; Thomas, S.; Gengenbach, T.; Jones, R.; Birbilis, N. Corros. Sci. 2018, 74(12), 1312–1317.

“Solid source growth of graphene with Ni-Cu catalysts: Towards high quality in situ graphene on silicon”. Mishra, N.; Boeckl, J.J.; Tadich, A.; Jones, R.T.; Pigram, P.J.; Edmonds, M.; Fuhrer, M.S.; Nichols, B.M.; Iacopi, F. J. Phys. D 2017, 50(9), 1–9.

“Surface Adsorbed Antibody Characterization Using ToF-SIMS with Principal Component Analysis and Artificial Neural Networks”. Welch, N.G.; Madiona, R.M.T.; Payten, T.B.; Jones, R.T.; Brack, N.; Muir, B.W.; Pigram, P.J. Langmuir 2016, 32(34), 8717–8728.