Dr Annalena Wolff

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Role in the Centre

Annalena (Lena) Wolff is supporting the Centcer with her expertise in focused ion beams and is part of the team around Amandeep, Konstantin, Ken, Prashant and Jose to help understand and develop Oriented on-surface epitaxy of dissimilar self-organized quantum dots

Short Biography

Annalena Wolff is a Research Infrastructure Specialist for Focused Ion Beams at the Central Analytical Research Facility at the Queensland University of Technology (QUT), Australia. She manages the university’s new Xe plasma FIB/SEM as well as the Helium Ion Microscope and supports the instrument user groups. Her research interests are the physics behind the systems and the development of novel FIB approaches and techniques. Lena received her PhD in Physics at Bielefeld University and then worked as an electron microscopist at the Monash Centre for Electron Microscopy before establishing herself as the go to person for focused ion beams at QUT.

Selected Publications

“Biowaste-Derived, Self-Organized Arrays of High-Performance 2D Carbon Emitters for Organic Light-Emitting Diodes” Singh, A.; Wolff, A.; Yambem, S.D.; Esmaeili, M.; Riches, J.D.; Shahbazi, M.; Feron, K.; Eftekhari, E.; Ostrikov, K.; Li, Q. Advanced Materials 2020, 32(10), 1906176.

“Superplastic nanoscale pore shaping by ion irradiation” Aramesh, M.; Mayamei, Y.; Wolff, A.; Ostrikov, K. Nat. Commun. 2018, 9, 835 1-8.

“Modelling of focused ion beam induced increases in sample temperature: a case study of heat damage in biological samples” Wolff, A.; Klingner, N.; Thompson, W.; Zhou, Y.; Lin, J., Peng, Y.; Ramshaw, J.; Xiao, Y. J. Microsc. 2018, 272(1), 47-59.

“Bactericidal effects of natural nanotopography of dragonfly wing on Escherichia coli” Bandara, C.D.; Singh, S.; Afara, I.O.; Wolff, A.; Tesfamichael, T.; Ostrikov, K.; Oloyede, A. ACS Appl. Mater. Interfaces 2017, 9(8), pp. 6746-6760.

“Oriented attachment explains cobalt ferrite nanoparticle growth in bioinspired syntheses” Wolff, A.; Hetaba, W.; Wissbrock, M.; Loffler, S.; Mill, N.; Eckstadt, K.; Dreyer, A.; Ennen, I.; Sewald, N.; Schattschneider, P.; Hutten, A. Beilstein J. Nanotechnol. 2014, 5, 210-218